P1149.6 Simulation Results by Technology
The results are listed by technology/frequency/termination here.
This is to facilitate investigating the behavior of a single such combination
with all defects.
To find a specific simulation instance, select the I/O
protocol, coupling, and termination from the hierarchical list below.
That will give you a page listing the 15
defect types, where you can select the specific simulation.
A final note: all plots are auto-scaled, so pay attention to the scales!
Some plots show very robust signals until you realize the scale is in microvolts.
- Bipolar CML (Vdd = Vref = Vtt = 3.3V, AMCC,
Source and sink termination built in.)
- CMOS CML (no model yet available)
- LVDS (Vdd = 2.5V, Vref=1.25V, Vtt=1.25V, IBM SA12E)
P1149.6 Chapter 6 Calculations
- AC coupled, high frequency (relative to coupling RC)
NOTE: source termination added
- AC coupled after termination, high frequency (relative to coupling RC)
NOTE: source termination added
- AC coupled, low frequency (relative to coupling RC)
NOTE: source termination added
- AC coupled, IEEE 1149.1 EXTEST
NOTE: source termination added
- DC coupled, IEEE 1149.6 AC_EXTEST
- DC coupled, IEEE 1149.1 EXTEST
- LVPECL (I/O Vdd=3.3V, Vref=2.0V, IBM)
P1149.6 Chapter 6 Calculations
- AC coupled, high frequency (relative to coupling RC)
NOTE: source termination added in new simulations
- AC coupled, low frequency (relative to coupling RC)
NOTE: source termination added in new simulations
- AC coupled after termination, low frequency (relative to coupling RC)
- AC coupled, IEEE 1149.1 EXTEST.
- DC coupled, IEEE 1149.6 AC_EXTEST.
- DC coupled, IEEE 1149.1 EXTEST.
- LVPECL to LVDS LVPECL driver AC coupled to LVDS receiver,
Low frequency, Center tapped to a reference voltage (Vtt)