cc/td/doc/product/core/cis12008
hometocprevnextglossaryfeedbacksearchhelp

Table of Contents

Running Diagnostics on the Cisco 12008

Running Diagnostics on the Cisco 12008

A comprehensive suite of field diagnostic tests is provided for testing the Cisco 12000 series line cards. The tests exercise the card's processor, memory, major components, and major data paths.

You can run the field diagnostics on any installed line card while the rest of the line cards continue to handle network traffic.

Purpose of the Diagnostic Tests

The line card diagnostic tests thoroughly exercise all of the major components and data paths of the line card and deliver a pass/fail message to the console and the alphanumeric displays on the line card under test.

If the line card under test fails the diagnostic tests, you should replace the card. Other than DRAM, the line card contains no user serviceable or replaceable parts.

Diagnostics can be run concurrently on multiple line cards. Diagnostic testing for a card stops when all tests are completed for that card or when an error is encountered.

If multiple line cards are being tested, the testing process stops only on a failing card; testing on the other cards continues.

The field diagnostics software image is bundled with the Cisco IOS software. Prior to testing, the diagnostics image is downloaded from the Gigabit Route Processor (GRP) to the target card. While the diagnostics are running, the card under test operates under the control of the diagnostic software.

Status messages are passed back and forth across the MBus between the card under test and the GRP. On completion of testing, the tested card sends a pass/fail message to the GRP, which, in turn, passes the message to the system console.

The GRP also sends the pass/fail message to the alphanumeric displays on the card under test. This message continues to be displayed until the Cisco IOS software is reloaded into line card memory.

Diagnostic Test Sequence

During testing of a line card, the following sequence of events occurs:

If the verbose mode is enabled (see the section below entitled "Format of Diagnostic Commands"), an expanded message stream listing the start time and completion time of each diagnostic test is displayed on the console.
If the verbose mode is not enabled, a minimum message stream is displayed on the console.

Format of Diagnostic Commands

You invoke the line card diagnostics tests by issuing the diagnostics command at the privileged user EXEC prompt. This command takes the following form:

Router#diag <slot number> [ halt | post | previous | verbose | wait ]

where:

<slot number> indicates the slot number of the card you want to test.

Table 6-1 lists the arguments that you can specify with the diagnostics command.

To display the arguments that you can specify with the diagnostics command, you can issue a diagnostics command at any time (specifying the slot number for the card you want to test), followed by the question mark. For example:

Router#diag 3 ?     
  halt      halt in-progress diagnostic
  post      execute POST (Power On Self Test)
  previous  examine last test results from eeprom
  verbose   verbose mode
  wait      prevent reloading and resuming operations after test
  

You can stop diagnostic testing at any time by issuing the following command:

Router#no diag slot

Table  6-1:
Arguments for the Diagnostics Command
Argument Description
slot number Required--Specifies the slot number of the line card to be tested. The diagnostic software determines the type of card in the slot and downloads the appropriate diagnostic image for testing the card.
halt Optional--Enables you to halt the execution of an in-progress diagnostic test.
post Optional--Initiates an EPROM-based extended power-on self-test (EPOST) only. The EPOST test suite is less comprehensive than the field diagnostics images; a pass/fail message is the only one returned to the system console.
previous Optional--Enables you to examine the contents of EEPROM to obtain the last diagnostic test results for the card.
verbose Optional--Specifies verbose mode, activating the maximum messaging capability of the diagnostics software. The default is the nonverbose mode, which minimizes the message stream to the console.
wait Optional--Prevents the diagnostics from reloading the Cisco IOS software to the line card after test completion. This argument causes the line card under test to enter an idle state. With the cards in this state, you must reload the Cisco IOS software image manually from the GRP in order for the card to resume normal operations.

Loading and Running the Diagnostics

This section presents the procedures for loading and running a suite of diagnostic tests on a Cisco 12000 series line card installed in the Cisco 12008 router. Included are sample console display messages. Diagnostic tests are run from the system console in privileged EXEC mode.

To load and run diagnostics on a line card, perform the following steps:

Step 1 From the user EXEC prompt (Router>), issue the enable command and the system password to enter the privileged EXEC mode.

Step 2 Determine the slot number of the line card you want to test and enter the diagnostics command.

The diagnostic tests are downloaded to the line card and executed.


Test status and administrative messages are displayed on the system console. At the end of testing, a pass/fail message is displayed on the console.


The number of messages displayed on the console depends on whether you have specified the verbose argument in the diagnostics command (see Table 6-1).


Effect of Verbose Argument on Diagnostic Tests

This section describes the effect of enabling or disabling the verbose argument during use of the diagnostics command.

All the examples shown in this section reflect output from diagnostic tests being run on a Quad OC-3c/STM-1c POS line card. While these examples are representative of diagnostics being run on such a card, note that output from diagnostics being run on other line card types will be different.

Verbose Mode Not Enabled -- Card Passes Tests

In the following example, it is assumed that diagnostics were run successfully on a line card installed in slot 3 without the verbose mode enabled.

While the diagnostic tests are running on the line card in slot 3, you have full control of the console. Thus, you can stop the diagnostic tests at any time on the line card in slot 3 (or any other line card slot) by issuing the halt command. This command takes the following form:

Router#diag 3 halt

With the verbose mode disabled, the following message stream is directed to the system console, indicating the progress of the diagnostic tests being performed on the line card installed in slot 3:

Router#diag 3      
Running DIAG config check
Running Diags will halt ALL activity on the requested slot.
[confirm]
Router# 
Launching a Field Diagnostic for slot 3
Downloading diagnostic tests to slot 3 (timeout set to 400 sec.)
Router#
Field Diag download SUCCESS
Executing all diagnostic tests in slot 3
(total/indiv. timeout set to 600/200 sec.)
Field Diagnostic ****PASSED**** for slot 3
Shutting down diags in slot 3
Board will reload

To examine the results of the diagnostic test in slot 3, you can issue the following command:

Router#diag 3 previous 
Field Diag eeprom values: run 1 fail mode 0 (PASS) slot 3
   last test failed was 0, error code 0

Verbose Mode Enabled -- Card Passes Tests

In the following example, it is assumed that diagnostics were run successfully on a line card installed in slot 3 with the verbose mode enabled. This example shows a typical message stream directed to the system console when the verbose option is enabled:

Router#diag 3 verbose
Running DIAG config check
Running Diags will halt ALL activity on the requested slot.
[confirm]
Router#
Launching a Field Diagnostic for slot 3
Downloading diagnostic tests to slot 3 (timeout set to 400 sec.)
Field Diag download SUCCESS
Executing all diagnostic tests in slot 3
(total/indiv. timeout set to 600/200 sec.)
FD 3> Verbosity now (0x1) TESTSDISP
FDIAG_STAT_IN_PROGRESS: test #1 R5K Internal Cache
FDIAG_STAT_IN_PROGRESS: test #2 Burst Operations
FDIAG_STAT_IN_PROGRESS: test #3 Subblock Ordering
FDIAG_STAT_IN_PROGRESS: test #4 Dram Marching Pattern
FDIAG_STAT_IN_PROGRESS: test #5 Dram Datapins
FDIAG_STAT_IN_PROGRESS: test #6 Dram Busfloat
FDIAG_STAT_IN_PROGRESS: test #7 L3FE Asic Registers
FDIAG_STAT_IN_PROGRESS: test #8 L3FE Dram Access
FDIAG_STAT_IN_PROGRESS: test #9 L3FE P4 Timeout
FDIAG_STAT_IN_PROGRESS: test #10 L3FE Asic General Purpose Counter
FDIAG_STAT_IN_PROGRESS: test #11 L3FE Asic Real Time Interrupt
FDIAG_STAT_IN_PROGRESS: test #12 L3FE Errors
.
.
.
.
.
FDIAG_STAT_IN_PROGRESS: test #13 L3FE DRAM Burst Operations Error
FDIAG_STAT_IN_PROGRESS: test #14 L3FE ToFab BMA SDram Read Around Write
FDIAG_STAT_IN_PROGRESS: test #15 L3FE FrFab BMA SDram Read Around Write
FDIAG_STAT_IN_PROGRESS: test #16 L3FE Dram Read Around Write
FDIAG_STAT_IN_PROGRESS: test #17 L3FE Dram Write Parity Error test
FDIAG_STAT_IN_PROGRESS: test #18 L3FE ToFab Network Interrupt Disable Timer
FDIAG_STAT_IN_PROGRESS: test #19 L3FE FrFab Network Interrupt Disable Timer
FDIAG_STAT_IN_PROGRESS: test #20 L3FE ToFab Network Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #21 L3FE FrFab Network Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #22 L3FE ToFab BMA Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #23 L3FE FrFab BMA Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #24 L3FE - To Fabric BMA Packet - Early Clear
FDIAG_STAT_IN_PROGRESS: test #25 L3FE - From Fabric BMA Packet - Early Clear
FDIAG_STAT_IN_PROGRESS: test #60 To Fabric FIA Asic BMA Bus Parity Error
FDIAG_STAT_IN_PROGRESS: test #61 To Fabric POS ASIC Registers
FDIAG_STAT_IN_PROGRESS: test #62 To Fabric POS FIFO SRAM Memory
FDIAG_STAT_IN_PROGRESS: test #63 To Fabric POS Length FIFO SRAM Memory
FDIAG_STAT_IN_PROGRESS: test #64 To Fabric POS External SRAM Parity Error
FDIAG_STAT_IN_PROGRESS: test #65 To Fabric POS Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #66 From Fabric POS ASIC Registers
FDIAG_STAT_IN_PROGRESS: test #67 From Fabric POS FIFO SRAM Memory
FDIAG_STAT_IN_PROGRESS: test #68 From Fabric POS Length FIFO SRAM Memory
FDIAG_STAT_IN_PROGRESS: test #69 From Fabric POS From BMA Parity Error
FDIAG_STAT_IN_PROGRESS: test #70 From Fabric POS Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #71 L3FE ToFab POS Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #72 L3FE FrFab POS Interrupt Mask
.
.
.
.
.
FDIAG_STAT_IN_PROGRESS: test #73 From Fabric BMA to To Fabric POS Packet Frame
FDIAG_STAT_IN_PROGRESS: test #74 From Fabric BMA to To Fabric BMA POS Packet Frame
FDIAG_STAT_IN_PROGRESS: test #75 From Fabric BMA to From Fabric POS Packet Frame
FDIAG_STAT_IN_PROGRESS: test #76 QOC3 Framer 0 Registers
FDIAG_STAT_IN_PROGRESS: test #77 QOC3 Framer 1 Registers
FDIAG_STAT_IN_PROGRESS: test #78 QOC3 Framer 2 Registers
FDIAG_STAT_IN_PROGRESS: test #79 QOC3 Framer 3 Registers
FDIAG_STAT_IN_PROGRESS: test #80 DCC 0 Registers
FDIAG_STAT_IN_PROGRESS: test #81 DCC 1 Registers
FDIAG_STAT_DONE
Field Diagnostic ****PASSED**** for slot 3
Field Diag eeprom values: run 1 fail mode 0 (PASS) slot 3
   last test failed was 0, error code 0
Shutting down diags in slot 3
Board will reload

As is evident from the preceding example, most of the message stream resulting from the verbose option relates to the points at which the individual diagnostic tests start and complete.

At the end of the diagnostic tests, a message is displayed indicating whether the card passed or failed a test.

Verbose Mode Not Enabled -- Card Fails Tests

The following example shows a diagnostic test that was initiated for a line card installed in slot 1 with the verbose mode not enabled. This test failed because the diagnostic software could not be downloaded to the card to be tested.

Router#diag 1
Running DIAG config check
Running Diags will halt ALL activity on the requested slot.
[confirm]
Router#
Launching a Field Diagnostic for slot 1
Downloading diagnostic tests to slot 1(timeout set to 400 sec.)
ERROR: TIMEOUT waiting UUT ready
ERROR: Field diagnostics cannot run on requested board
Field Diagnostic: ****DOWNLOAD FAILURE**** while preparing slot 1

Shutting down diags in slot 1

slot 1 done, will not reload automatically
Router#

Verbose Mode Enabled -- Card Fails Tests

The following example shows that the diagnostic tests being run on the line card installed in slot 6 with the verbose mode enabled could not be completed successfully because of the failure of test 67.

Router#diag 6 verbose
Running DIAG config check
Runnning Diags will halt ALL activity on the requested slot.
[confirm]
Router#
Launching a Field Diagnostic for slot 6
Downloading diagnostic tests to slot 6 (timeout set to 400 sec.)
%MBUS-0-DOWNREV: Rom Monitor in slot 6 
%MBUS-0-DOWNREV: Fabric Downloader in slot 6 
Field Diag download SUCCESS
Executing all diagnostic tests in slot 6
(total/indiv. timeout set to 600/200 sec.)
FD 6> Verbosity now (0x1) TESTSDISP
FDIAG_STAT_IN_PROGRESS: test #1 R5K Internal Cache
FDIAG_STAT_IN_PROGRESS: test #2 Burst Operations
FDIAG_STAT_IN_PROGRESS: test #3 Subblock Ordering
FDIAG_STAT_IN_PROGRESS: test #4 Dram Marching Pattern
FDIAG_STAT_IN_PROGRESS: test #5 Dram Datapins
FDIAG_STAT_IN_PROGRESS: test #6 Dram Busfloat
FDIAG_STAT_IN_PROGRESS: test #7 L3FE Asic Registers
FDIAG_STAT_IN_PROGRESS: test #8 L3FE Dram Access
FDIAG_STAT_IN_PROGRESS: test #9 L3FE P4 Timeout
FDIAG_STAT_IN_PROGRESS: test #10 L3FE Asic General Purpose Counter
.
.
.
.
.
FDIAG_STAT_IN_PROGRESS: test #26 L3FE Prefetch/Write Buffers
FDIAG_STAT_IN_PROGRESS: test #27 To Fabric (RX) BMA MS Register Memory
FDIAG_STAT_IN_PROGRESS: test #28 To Fabric (RX) BMA Prefetch Buffers
FDIAG_STAT_IN_PROGRESS: test #29 To Fabric (RX) BMA Micro Sequencer Scratch Me
FDIAG_STAT_IN_PROGRESS: test #30 To Fabric (RX) BMA FIA Interface Buffer Memory
FDIAG_STAT_IN_PROGRESS: test #31 To Fabric (RX) BMA PLIM Buffers
FDIAG_STAT_IN_PROGRESS: test #32 To Fabric (RX) BMA FIA Interface SRR Memory
FDIAG_STAT_IN_PROGRESS: test #33 To Fabric (RX) BMA Micro Sequencer Instruction
FDIAG_STAT_IN_PROGRESS: test #34 To Fabric (RX) BMA Q Manager SRAM Busfloat
FDIAG_STAT_IN_PROGRESS: test #35 To Fabric (RX) BMA Q Manager SRAM Datapins
.
.
.
.
.
FDIAG_STAT_IN_PROGRESS: test #52 From Fabric (TX) BMA to L3FE Packet
FDIAG_STAT_IN_PROGRESS: test #53 From Fabric (TX) BMA SDRAM Marching Pattern
FDIAG_STAT_IN_PROGRESS: test #54 From Fabric (TX) BMA SDRAM Datapins
FDIAG_STAT_IN_PROGRESS: test #55 From Fabric (TX) BMA Micro Sequencer Scratch 
FDIAG_STAT_IN_PROGRESS: test #56 To Fabric FIA Asic Registers
FDIAG_STAT_IN_PROGRESS: test #57 To Fabric FIA Asic Packet
FDIAG_STAT_IN_PROGRESS: test #58 From Fabric FIA Asic Registers
FDIAG_STAT_IN_PROGRESS: test #59 To Fabric FIA Asic Cisco Cell Parity Error
FDIAG_STAT_IN_PROGRESS: test #60 To Fabric FIA Asic BMA Bus Parity Error
FDIAG_STAT_IN_PROGRESS: test #61 To Fabric POS ASIC Registers
FDIAG_STAT_IN_PROGRESS: test #62 To Fabric POS FIFO SRAM Memory
FDIAG_STAT_IN_PROGRESS: test #63 To Fabric POS Length FIFO SRAM Memory
FDIAG_STAT_IN_PROGRESS: test #64 To Fabric POS External SRAM Parity Error
FDIAG_STAT_IN_PROGRESS: test #65 To Fabric POS Interrupt Mask
FDIAG_STAT_IN_PROGRESS: test #66 From Fabric POS ASIC Registers
FDIAG_STAT_IN_PROGRESS: test #67 From Fabric POS FIFO SRAM Memory
FDIAG_STAT_DONE_FAIL test_num 67, error_code 1
Field Diagnostic: ****TEST FAILURE**** slot 6: last test run 67,
>From Fabric POS FIFO SRAM Memory, error 1
Field Diag eeprom values: run 1 fail mode 1 (TEST FAILURE) slot 6
   last test failed was 67, error code 1
Shutting down diags in slot 6
slot 6 done, will not reload automatically

hometocprevnextglossaryfeedbacksearchhelp
Copyright 1989-1998 © Cisco Systems Inc.